Transitions radiatives du cœur à la bande de valence dans les cristaux CsCl et CsCaCl2MEL'CHAKOV, E.N; RODNYJ, P.A; RYBAKOV, B.V et al.Fizika tverdogo tela. 1989, Vol 31, Num 5, pp 276-278, issn 0367-3294Article

Surface quantitative analysis of Cr-O systems by XPSBATTISTONI, C; COSSU, G; MATTOGNO, G et al.Surface and interface analysis. 1983, Vol 5, Num 4, pp 173-176, issn 0142-2421Article

X-ray absorption and X-ray photoelectron spectroscopy of a rhodium colloidROTHE, J; POLLMANN, J; FRANKE, R et al.Fresenius' journal of analytical chemistry. 1996, Vol 355, Num 3-4, pp 372-374, issn 0937-0633Conference Paper

Quantitative XPS analysis considering elastic scatteringEBEL, H; EBEL, M. F; WERNISCH, J et al.Surface and interface analysis. 1984, Vol 6, Num 3, pp 140-143, issn 0142-2421Article

The influence of X-ray-induced Auger electrons in quantitative electron-induced Auger spectroscopyCAZAUX, J; MOUTOU, S.Surface and interface analysis. 1984, Vol 6, Num 2, pp 62-67, issn 0142-2421Article

Sensitivity factors from XPS analysis of surface atomsWAGNER, C. D.Journal of electron spectroscopy and related phenomena. 1983, Vol 32, Num 2, pp 99-102, issn 0368-2048Article

Metal overlayers on organic functional groups of self-organized molecular assemblies. II: X-ray photoelectron spectroscopy of interactions of Cu/CN on 12-mercaptododecanenitrileJUNG, D. R; KING, D. E; CZANDERNA, A. W et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1993, Vol 11, Num 4, pp 2382-2386, issn 0734-2101, 2Conference Paper

XPS: energy calibration of electron spectrometers. II: Results of an interlaboratory comparisonANTHONY, M. T; SEAH, M. P.Surface and interface analysis. 1984, Vol 6, Num 3, pp 107-115, issn 0142-2421Article

Surface characterization of chrysotile asbestos by X-ray photoelectron spectroscopy and scanning Auger spectroscopyPATHAK, B; SEBASTIEN, P.Canadian journal of spectroscopy. 1985, Vol 30, Num 1, pp 1-6, issn 0045-5105Article

Effects of elastic photoelectron collisions in quantitative XPSJABLONSKI, A; EBEL, H.Surface and interface analysis. 1984, Vol 6, Num 1, pp 21-28, issn 0142-2421Article

XPS: energy calibration of electron spectrometers. I: An absolute, traceable energy calibration and the provision of atomic reference line energiesANTHONY, M. T; SEAH, M. P.Surface and interface analysis. 1984, Vol 6, Num 3, pp 95-106, issn 0142-2421Article

X-ray photoelectron spectroscopy study of the surface composition of CoO-MgO solid solutionsCIMINO, A; DE ANGELIS, B. A; MINELLI, G et al.Surface and interface analysis. 1983, Vol 5, Num 4, pp 150-154, issn 0142-2421Article

Prospects for resonant photoexcitation as a pumping mechanism for x-ray lasersCHICHKOV, B. N; FILL, E. E.Physical review. A, General physics. 1990, Vol 42, Num 1, pp 599-610, issn 0556-2791Article

GaAs oxides formed at room temperature in air: comparison of X-ray photoelectron spectroscopic and ion microprobe mass analysisDEMANET, C. M; RAWSTHORNE, E. D; STANDER, C. M et al.Surface and interface analysis. 1985, Vol 7, Num 4, pp 159-162, issn 0142-2421Article

The antioxidation effect of boron oxide on a pyocarbonCHESNEAU, M; BEGUIN, F; CONARD, J et al.Carbon (New York, NY). 1992, Vol 30, Num 4, pp 714-716, issn 0008-6223Article

He(I) photoelectron studies of lidocaine films on liquid surfacesBALLARD, R. E; JONES, J; READ, D et al.Chemical physics letters. 1988, Vol 144, Num 2, pp 114-118, issn 0009-2614Article

Quantitative surface analysis by XPS: a comparison among different quantitative approachesBATTISTONI, C; MATTOGNO, G; PAPARAZZO, E et al.Surface and interface analysis. 1985, Vol 7, Num 3, pp 117-121, issn 0142-2421Article

Small area X-ray photoelectron spectroscopyYATES, K; WEST, R. H.Surface and interface analysis. 1983, Vol 5, Num 5, pp 217-221, issn 0142-2421Article

Determination of external surface composition of zeolite particles by synchrotron radiation XPSSHIMADA, H; MATSUBAYASHI, N; IMAMURA, M et al.Catalysis letters. 1996, Vol 39, Num 1-2, pp 125-128, issn 1011-372XArticle

X-ray photoelectron spectroscopy of thermally treated SiO₂ surfacesMILLER, M. L; LINTON, R. W.Analytical chemistry (Washington, DC). 1985, Vol 57, Num 12, pp 2314-2319, issn 0003-2700Article

XPS investigation of the effects induced by the silanization on real glass surfacesPUGLISI, O; TORRISI, A; MARLETTA, G et al.Journal of non-crystalline solids. 1984, Vol 68, Num 2-3, pp 219-230, issn 0022-3093Article

Applications of AES and XPS to characterization of aluminium and its compoundsTAPPING, R. L; AITCHISON, I; GOAD, D. G. W et al.Canadian journal of spectroscopy. 1983, Vol 28, Num 3, pp 87-94, issn 0045-5105Article

Concentration depth profiles by XPS; A new approachTOUGAARD, S; IGNATIEV, A.Surface science. 1983, Vol 129, Num 2-3, pp 355-365, issn 0039-6028Article

Surface modification and characterization of carbon black with oxygen plasmaTAKADA, T; NAKAHARA, M; KUMAGAI, H et al.Carbon (New York, NY). 1996, Vol 34, Num 9, pp 1087-1091, issn 0008-6223Article

Calibration of an X-ray photoelectron spectrometer by means of noble metalsEBEL, M. F; EBEL, H; ZUBA, G et al.Surface and interface analysis. 1983, Vol 5, Num 4, pp 170-172, issn 0142-2421Article